Formation by ion mixing of almn thin films in amorphous and quasi-crystalline phases: Comparison of their electronic structure as determined by optical measurements
- 15 December 1988
- journal article
- Published by Elsevier in Journal of the Less Common Metals
- Vol. 145, 429-436
- https://doi.org/10.1016/0022-5088(88)90300-1
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Electronic structure of the icosahedral and other phases of aluminum-manganese alloys studied by soft-x-ray emission spectroscopyPhysical Review B, 1988
- Electronic structure of quasi-crystalline AlMn in comparison with amorphous and crystalline alloysMaterials Science and Engineering, 1988
- Electronic structure of amorphous transition metal alloysMaterials Science and Engineering, 1988
- Formation of icosahedral Al-Mn and related phases by ion beam mixingNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- Formation of Icosahedral Al(Mn) by Directed Energy ProcessesPhysical Review Letters, 1985
- Structure of Rapidly Quenched Al-MnPhysical Review Letters, 1985
- Metallic Phase with Long-Range Orientational Order and No Translational SymmetryPhysical Review Letters, 1984
- Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicatesRevue de Physique Appliquée, 1980