Hyperspectral Crop Reflectance Data for characterising and estimating Fungal Disease Severity in Wheat
- 1 May 2005
- journal article
- Published by Elsevier in Biosystems Engineering
- Vol. 91 (1) , 9-20
- https://doi.org/10.1016/j.biosystemseng.2005.02.007
Abstract
No abstract availableThis publication has 36 references indexed in Scilit:
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