Contact resistance and saturation effects in the scanning tunnelling microscope: the resistance quantum unit
- 1 November 1988
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 152 (2) , 317-323
- https://doi.org/10.1111/j.1365-2818.1988.tb01392.x
Abstract
No abstract availableKeywords
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