On the temperature dependence of the sizes of defects produced in copper by bombardment with 30 ke V -Cu + IONS
- 1 January 1982
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 67 (3) , 95-99
- https://doi.org/10.1080/01422448108226848
Abstract
Measurements of the sizes of defects produced in Cu by ion bombardment between 6 K and 295 K have been carried out. Contrary to previous investigations a dependence of the mean defect size on the irradiation temperature was not found.Keywords
This publication has 3 references indexed in Scilit:
- Investigation of the nature of stage-IE interstitials in fcc metals by means of transmission electron microscopyJournal of Nuclear Materials, 1978
- Unterscheidung zwischen modellen der strahlenschädigung mit hilfe elektronenmikroskopischer untersuchungen von ionenschäden in metallenRadiation Effects, 1978
- Elektronenmikroskopische untersuchung der strahlenschädigung in kupfer durch schwere ionen im keV-energiebereichPhilosophical Magazine, 1972