Effect of an Electric Field on the Optical Gap of Ge(111) 2 × 1 Surface States
- 4 October 1976
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 37 (14) , 934-937
- https://doi.org/10.1103/physrevlett.37.934
Abstract
Results of electric field modulation of internal reflections in cleaved Ge(111) 2 × 1 surfaces are presented. They can be interpreted on the basis of a buckled model of the reconstructed surface with raised (lowered) atoms negatively (positively) charged. The value of the force constant for normal displacement of surface ions (1.1 × dyn ) is estimated.
Keywords
This publication has 17 references indexed in Scilit:
- The Si(2 × 1) surface: A theory of its spectroscopyPhysical Review B, 1975
- Core-Electron Excitation Spectra of Si, SiO, and SiPhysical Review Letters, 1975
- Energy Bands of Reconstructed Surface States of Cleaved SiPhysical Review Letters, 1975
- Photoemission and energy loss spectroscopy on semiconductor surfacesSurface Science, 1975
- Photoemission Partial Yield Measurements of Unoccupied Intrinsic Surface States for Ge(111) and GaAs(110)Physical Review Letters, 1974
- Measurement of the Angle of Dangling-Bond Photoemission from Cleaved SiliconPhysical Review Letters, 1974
- Optical Absorption of Surface States in Ultrahigh Vacuum Cleaved (111) Surfaces of Ge and SiPhysical Review B, 1971
- Determination of Surface States at Clean, Cleaved Silicon Surfaces from PhotoconductivityPhysical Review Letters, 1971
- Optical Detection of Surface States on Cleaved (111) Surfaces of GePhysical Review Letters, 1968
- Electron Paramagnetic Resonance from Clean Single-Crystal Cleavage Surfaces of SiliconPhysical Review B, 1968