On Minimally Testable Logic Networks
- 1 May 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-23 (5) , 552-554
- https://doi.org/10.1109/T-C.1974.223981
Abstract
A new technique to modify any logic network to facilitate diagnosis is given. By providing extra controllable inputs (at most six) and observable outputs it is shown that any number of stuck-at-faults in a logic network can be detected by applying only three tests. This number is believed to be minimal for networks using current technologies. Example of logic module that can be used to realize any logic function such that only two tests detect stuck-at-faults is also given.Keywords
This publication has 1 reference indexed in Scilit:
- On Modifying Logic Networks to Improve Their DiagnosabilityIEEE Transactions on Computers, 1974