A method of rapidly obtaining concentration-depth profiles from x-ray diffraction
- 1 August 1985
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 58 (3) , 1095-1101
- https://doi.org/10.1063/1.336121
Abstract
The construction of composition profiles from x-ray diffraction peaks is an important and reliable technique, but it has not been widely adopted because it required hours of computer time and/or complicated optimization routines. The method proposed here utilizes an easily evaluated analysis of the diffraction peak. It is applicable to thin films and thick specimens for which the variation with composition of lattice parameters, linear absorption coefficient, and reflectivity are known. A deconvolution scheme is outlined that includes corrections for the instrumental broadening and singlet or doublet radiation.This publication has 3 references indexed in Scilit:
- X-ray diffraction approach to grain boundary and volume diffusionJournal of Applied Physics, 1973
- X-Ray Diffraction Technique for the Investigation of Small Diffusion ZonesJournal of Applied Physics, 1970
- X-Ray Diffraction from a Binary Diffusion ZoneJournal of Applied Physics, 1970