Structure and Properties of Ultrathin Ge-Si Superlattices
- 1 January 1986
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained-layer heterostructuresApplied Physics Letters, 1985
- Raman scattering from GexSi1−x/Si strained-layer superlatticesApplied Physics Letters, 1984
- Commensurate and incommensurate structures in molecular beam epitaxially grown GexSi1−xfilms on Si(100)Journal of Applied Physics, 1984
- Theory of silicon superlattices: Electronic structure and enhanced mobilityJournal of Applied Physics, 1983
- A one-dimensional SiGe superlattice grown by UHV epitaxyApplied Physics A, 1975