Determination of Trace Impurities in Graphite and Silicon Carbide by Total Reflection X-ray Fluorescence Spectrometry after Homogeneous Liquid-Liquid Extraction.
- 1 January 2000
- journal article
- Published by Iron and Steel Institute of Japan in ISIJ International
- Vol. 40 (8) , 779-782
- https://doi.org/10.2355/isijinternational.40.779
Abstract
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