A DC technique for determining GaAs MESFET thermal resistance

Publisher Website

1 January 1989

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/stherm.1989.76079

Abstract

No abstract available

Keywords

This publication has 4 references indexed in Scilit:

Thermo-reliability relationships of GaAs ICs
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Thermal resistance of GaAs field-effect transistors
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IEEE Transactions on Electron Devices, 1976
A surface temperature limit detector using nematic liquid crystals with an application to microcircuits
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