I n s i t u tip exchange mechanism for the Demuth-type scanning tunneling microscope
- 1 March 1991
- journal article
- research article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 9 (2) , 623-625
- https://doi.org/10.1116/1.585472
Abstract
The probing tip plays a most important role on the performance and resolution of the scanning tunneling microscope (STM). If damaged, the tip must be replaced, idealy without breaking the ultrahigh vacuum conditions of the STM. We have developed a new in situ tip-exchange device for the widely-used "Demuth-type" STM without compromising the performance and simplicity of the system. The device can be incorporated into any STM system with an in-situ sample exchange mode.Keywords
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