Computer simulation and analysis of high-resolution electron microscope images and diffraction patterns with partial coherence, hollow cone illumination, and virtual apertures
- 1 January 1984
- journal article
- research article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 1 (2) , 107-130
- https://doi.org/10.1002/jemt.1060010202
Abstract
No abstract availableKeywords
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