Measurement of the fourth moment of the current distribution in two-dimensional random resistor networks

Abstract
Using a new experimental technique, we have measured the fourth moment of the current distribution in two-dimensional random resistor networks. The fourth moment is proportional to relative resistance fluctuations in a network of noisy resistors, and, until now, noise measurements provided the only experimental probe of this higher moment. We show that the fourth moment is simply related to the resistance change due to joule heating in a network of temperature-dependent resistors. We report measurements on both square-lattice and random-void continuum networks, fabricated by scribing computer-generated percolation patterns on sheets of aluminized Mylar.