A practical approach to the periodic continuation method for the simulation of high resolution TEM images of isolated crystal defects
- 31 December 1984
- journal article
- research article
- Published by Elsevier in Ultramicroscopy
- Vol. 13 (3) , 343-347
- https://doi.org/10.1016/0304-3991(84)90214-6
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Calculation of the scattering from defects using periodic continuation methodsPhilosophical Magazine A, 1982
- Fast computational procedures for the simulation of structure images in complex or disordered crystals: a new approachJournal of Microscopy, 1980
- Experimental and calculated images of planar defects at high resolutionPhilosophical Magazine, 1977