Influence of tester, test method, and device type on CDM ESD testing
- 1 June 1995
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A
- Vol. 18 (2) , 284-294
- https://doi.org/10.1109/95.390307
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A correlation study between different types of CDM testers and "real" manufacturing in-line leakage failuresIEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A, 1995
- A CDM‐only reproducible field degradation and its reliability aspectQuality and Reliability Engineering International, 1994
- Mechanisms of charged-device electrostatic dischargesJournal of Electrostatics, 1992