The field ionization characteristics of individual atomic planes
- 30 September 1971
- journal article
- Published by Elsevier in Surface Science
- Vol. 27 (2) , 231-255
- https://doi.org/10.1016/0039-6028(71)90031-8
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- On the atomic resolution of a field ion microscopeSurface Science, 1971
- On the heating of a field ion microscope specimenPhilosophical Magazine, 1971
- Surface Electronic States and Field-Ion Image Intensity of MetalsJapanese Journal of Applied Physics, 1970
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- Atomic Binding of Transition Metals on Clean Single-Crystal Tungsten SurfacesThe Journal of Chemical Physics, 1968
- Current—Voltage Characteristics by Image Photometry in a Field-Ion MicroscopeJournal of Applied Physics, 1966
- Some Observations on Low-Temperature Field-Ion MicroscopyJournal of Applied Physics, 1966
- Gas-Surface Interactions and Field-Ion Microscopy of Nonrefractory MetalsJournal of Applied Physics, 1965
- Current-voltage characteristics of the helium field-ion microscopePhilosophical Magazine, 1963
- Field Ionization of Gases at a Metal Surface and the Resolution of the Field Ion MicroscopePhysical Review B, 1956