Transmission and Surface Intensity Profiles in Random Media
- 20 June 1993
- journal article
- Published by IOP Publishing in Europhysics Letters
- Vol. 22 (9) , 675-680
- https://doi.org/10.1209/0295-5075/22/9/007
Abstract
We have performed a series of measurements of transmission and surface intensity profiles vs. thickness in which the coherent depth of penetration and the surface reflectivities are varied independently. The excellent agreement of diffusion theory which includes interfacial coupling in a natural way allows us to determine the domain of validity of the diffusion model and to obtain the first accurate values for the coherent penetration depth and the optical transport mean free path.Keywords
This publication has 15 references indexed in Scilit:
- Measurement of the transport mean free path of diffusing photonsPhysical Review B, 1992
- Problem of light diffusion in strongly scattering mediaPhysical Review Letters, 1992
- Internal reflection of diffusive light in random mediaPhysical Review A, 1991
- Speed of propagation of classical waves in strongly scattering mediaPhysical Review Letters, 1991
- Surface reflections and optical transport through random media: Coherent backscattering, optical memory effect, frequency, and dynamical correlationsPhysical Review B, 1990
- Diffusing-wave spectroscopy and multiple scattering of light in correlated random mediaPhysical Review B, 1989
- Memory Effects in Propagation of Optical Waves through Disordered MediaPhysical Review Letters, 1988
- Optical Transmission in Disordered MediaPhysical Review Letters, 1987
- Coherent Backscattering of Light by Disordered Media: Analysis of the Peak Line ShapePhysical Review Letters, 1986
- Scattering and diffusion of a beam wave in randomly distributed scatterersJournal of the Optical Society of America, 1983