A qualitative ellipsometric-electrochemical approach to the study of film growth under organic coatings
- 1 June 1980
- journal article
- Published by Elsevier in Surface Science
- Vol. 96 (1-3) , 364-374
- https://doi.org/10.1016/0039-6028(80)90314-3
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A new resonant ellipsometric technique for characterizing the interface between GaAs and its plasma-grown oxideJournal of Applied Physics, 1978
- Qualitative use of ellipsometry to study localized corrosion processesSurface Science, 1976
- Tribo-Ellipsometry: A New Technique to Study the Relationship of Repassivation Kinetics to Stress CorrosionCorrosion, 1972