Characterization Of Grain Boundaries Observed In Polycrystalline Silicon For Solar Cell Applications
- 1 January 1980
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 118 (1) , 105-110
- https://doi.org/10.1111/j.1365-2818.1980.tb00252.x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Grain boundary analysis in TEM. I. Practical determination of bicrystal orientationsPhysica Status Solidi (a), 1978
- Electrical and structural characterization of silicon ribbons produced through capillary action shapingJournal of Crystal Growth, 1978
- Determination of crystal orientation by a zone axis method application to grain boundariesProceedings, annual meeting, Electron Microscopy Society of America, 1978
- Low cost silicon for solar energy applicationPhysica Status Solidi (a), 1977
- Coincidence-site lattices and complete pattern-shift in cubic crystalsActa Crystallographica Section A, 1974