The Illuminating System of the Electron Microscope
- 1 July 1949
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 20 (7) , 700-706
- https://doi.org/10.1063/1.1698511
Abstract
Using a self‐biased electron gun the current arriving at the specimen, the current density at the specimen, and the area of illumination of the specimen have been determined for different values of the filament height. The variation of current density at the specimen with angular aperture of illumination has been determined and the results compared with those for the zero‐biased gun. The performance of the self‐biased gun is assessed and some of the factors involved in its operation and maintenance are discussed.This publication has 4 references indexed in Scilit:
- The Optics of Three-Electrode Electron GunsJournal of Applied Physics, 1947
- A Discussion of the Illuminating System of the Electron MicroscopeJournal of Applied Physics, 1945
- Über ein neues Universal-Elektronenmikroskop mit Hochleistungsmagnet-Objektiv und herabgesetzter thermischer ObjektbelastungColloid and Polymer Science, 1944
- A Compact High Resolving Power Electron MicroscopeJournal of Applied Physics, 1943