Correlation Between Low-frequency Noise Overshoot In SOI MOSFETs And Frequency Dependence Of Floating Body Effect

Publisher Website

1 January 1997

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 99-100
https://doi.org/10.1109/vlsit.1997.623714

Abstract

No abstract available

Keywords

This publication has 3 references indexed in Scilit:

The kink-related excess low-frequency noise in silicon-on-insulator MOST's
IEEE Transactions on Electron Devices, 1994
A 1/f noise technique to extract the oxide trap density near the conduction band edge of silicon
IEEE Transactions on Electron Devices, 1989
Analysis of Noise Upconversion in Microwave FET Oscillators
IEEE Transactions on Microwave Theory and Techniques, 1985