The effect of multiple diffraction on the electron-microscope image

• 1 June 1972
• journal article
• Published by International Union of Crystallography (IUCr) in Journal of Applied Crystallography
• Vol. 5  (3) , 239-240
• https://doi.org/10.1107/s0021889872009288

Abstract

Keywords

• MULTIPLE SCATTERING
• ELECTRON MICROSCOPES
• INCREASED RESOLUTION
• HIGHLY CORRECTED
• REFLECTION MICROSCOPES
• CORRECTED LENS
• THINNER SPECIMENS
• SIMPLE LINE