Calculation of relative x‐ray fluorescence intensity for annular‐source geometry by the Monte Carlo method
- 1 October 1986
- journal article
- Published by Wiley in X-Ray Spectrometry
- Vol. 15 (4) , 289-293
- https://doi.org/10.1002/xrs.1300150412
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- An XRF method for the determination of the efficiency of Si(Li) detectors in an extended-source geometry by using thick specimensNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
- Photon cross sections from 1 keV to 100 MeV for elements Z=1 to Z=100Atomic Data and Nuclear Data Tables, 1970