Wide Angle X-ray Line Profile Analysis of Post-neck Drawn Filaments of HDPE

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Abstract
Wide angle X-ray diffraction technique was used to characterize a series of post-neck drawn high density polyethylene filaments which were stretched by a two-stage drawing process. The first stage of this drawing process utilizes 100%/min draw rate until the natural draw ratio of 8–10 × ist attained. In the second stage, the fully necked filament is re-clamped and further stretched at lower stretch rate (1%/min) upto the desired stretch ratio. Wide angle X-ray diffraction data were analyzed using the Warren-Averbach fourier technique. This analysis showed that number average crystallite size increase with increasing draw ratio. In addition, the root mean square strains (∊2)½ in the crystals decreased with increasing draw ratio upto the draw ratio of 25 then showed an increase with further increase of draw ratio.

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