Direct structure imaging of long period Ni3±xTe2 superstructures
- 16 June 1979
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 53 (2) , 423-431
- https://doi.org/10.1002/pssa.2210530202
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- On the diffraction features of two-layer systems. Application to Ni3±xTe2Physica Status Solidi (a), 1979
- Long period superstructures related to partial ordering in Ni3±xTe2 as studied by means of electron diffractionPhysica Status Solidi (a), 1979
- Diffraction effects due to shear structures: A new method for determining the shear vectorMaterials Research Bulletin, 1970