High Frequency Characterization Of Tape-Automated Bonding (TAB) Interconnects
- 8 September 1988
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- Vol. 0947, 81
- https://doi.org/10.1117/12.947451
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: