Precise determination of the relative orientation of two crystals from the analysis of spot diffraction patterns
- 16 April 1977
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 40 (2) , 599-603
- https://doi.org/10.1002/pssa.2210400227
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- The beam-tilt device of an electron microscope as an internal diffraction standardJournal of Physics E: Scientific Instruments, 1976
- The use of the beam tilt circuitry of an electron microscope for rapid determination of lattice constantsJournal of Physics E: Scientific Instruments, 1975
- Precise Determination of the Relative Orientation of Two Crystals from the Analysis of Two Kikuchi PatternsPhysica Status Solidi (a), 1975
- Crystal Defects and Crystalline InterfacesPublished by Springer Nature ,1970