Electron backscatter diffraction of grain and subgrain structures — resolution considerations
- 1 September 1999
- journal article
- research article
- Published by Wiley in Journal of Microscopy
- Vol. 195 (3) , 212-216
- https://doi.org/10.1046/j.1365-2818.1999.00579.x
Abstract
Characterization of microstructures containing small grains or low‐angle grain boundaries by electron backscattered diffraction (EBSD) is limited by the spatial and angular resolution limits of the t...Keywords
This publication has 3 references indexed in Scilit:
- Quantitative metallography by electron backscattered diffractionJournal of Microscopy, 1999
- Electron backscatter diffraction and orientation imaging microscopyMaterials Science and Technology, 1997
- Automatic analysis of electron backscatter diffraction patternsMetallurgical Transactions A, 1992