Crack networks in thin films
- 1 August 1993
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine Letters
- Vol. 68 (2) , 63-68
- https://doi.org/10.1080/09500839308240494
Abstract
We present a simple simulation for the development of crack networks in thin films. These networks are found to be statistically self-similar as the number of cracks increases. The distributions of shapes and sizes found in the simulations compare favourably with those observed in experimental films. The scaling behaviour helps to explain the similarity between crack networks found in a variety of real systems.Keywords
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