Interferometric characterization of 160 fs far-infrared light pulses
- 19 August 1991
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 59 (8) , 893-895
- https://doi.org/10.1063/1.105268
Abstract
We report the first interferometric characterization of freely propagating, subpicosecond, far-infrared (FIR) light pulses. FIR light was generated via short pulse photoexcitation of a semi-insulating InP wafer. The half width of the intensity interferogram was 230 fs. The FIR light contained frequency components from 3 to 150 cm−1.Keywords
This publication has 9 references indexed in Scilit:
- Efficient generation of 380 fs pulses of THz radiation by ultrafast laser pulse excitation of a biased metal-semiconductor interfaceApplied Physics Letters, 1991
- Picosecond pump and probe spectroscopy utilizing freely propagating terahertz radiationOptics Letters, 1991
- Subpicosecond electromagnetic pulses from large-aperture photoconducting antennasOptics Letters, 1990
- Generation of femtosecond electromagnetic pulses from semiconductor surfacesApplied Physics Letters, 1990
- High-brightness terahertz beams characterized with an ultrafast detectorApplied Physics Letters, 1989
- Subpicosecond photoconducting dipole antennasIEEE Journal of Quantum Electronics, 1988
- Cherenkov Radiation from Femtosecond Optical Pulses in Electro-Optic MediaPhysical Review Letters, 1984
- Polarised interferometric spectrometry for the millimetre and submillimetre spectrumInfrared Physics, 1970
- The determination of refractive index spectra by fourier spectrometryInfrared Physics, 1969