Detection of plate-like defects by light-scattering tomography

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Abstract
Light-scattering tomographs were obtained in which the image contrast was dependent upon the direction of the light-scattering vector. The analysis in this paper confirms experimentally that a plate-like irregularity with a refractive index different from the matrix shows a specular reflection as long as the scattering vector is maintained perpendicular to the planes of the defects. In an as-grown synthetic quartz crystal, the plate-like scatterers lie approximately parallel to the m, X and Z planes or (1010), (2110) and (0001) planes respectively. The paper concentrates on the scatterers on the m planes in order to make clear the nature and physical properties of the plate-like defects. The sizes of the defects have been obtained from the angular dependence of the scattered intensity based on theoretical calculations. These defects in synthetic quartz crystals are caused by the accumulation of impurities during growth.