Secondary Emission from Nichrome V, CuBe, and AgMg Alloy Targets Due to Positive Ion Bombardment
- 1 July 1954
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 25 (7) , 883-886
- https://doi.org/10.1063/1.1721762
Abstract
A mass spectrometer ion collector system has been devised for the investigation of secondary electron emission by impact of ions on surfaces. Results are reported for various ions incident on clean, baked (but not atomically clean) surfaces of AgMg, CuBe, and Nichrome V targets. For rare gas isotopic ions it is found that for a given energy ion the value of γ varies approximately inversely with the square root of the mass.This publication has 6 references indexed in Scilit:
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