Interface broadening during ion plating
- 1 January 1980
- journal article
- Published by Taylor & Francis in Radiation Effects
- Vol. 50 (2) , 45-50
- https://doi.org/10.1080/01422448008225598
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The influence of distortions on apparent surface radiation damage cross sections in SiRadiation Effects, 1979
- A comparison of vacuum-evaporated and ion-plated thin films using Auger electron spectroscopyThin Solid Films, 1978