Observation of radiative electron capture intoK,L,Mshells of 25-MeV/uXe53+ions channeled in silicon

We present experimental results showing that channeling measurements with fast stripped heavy ions incident on thin crystals can allow a detailed study of radiative electron capture. Charge-state measurements and photon-energy spectra have been used to deduce cross sections of radiative capture into the K, L, and M shells of 25-MeV/u ${\mathrm{Xe}}^{53+}$ ions. The orientation dependence of the positions and shapes of associated photon lines has been observed.