Electron microscope and electron diffraction investigations of boron thin-film structure
- 30 June 1976
- journal article
- Published by Elsevier in Journal of the Less Common Metals
- Vol. 47, 255-258
- https://doi.org/10.1016/0022-5088(76)90104-1
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- An Analysis of Polymorphism in Boron Based upon X-Ray Diffraction Results1Journal of the American Chemical Society, 1960