X-Ray Detector for Dynamic Diffraction Studies
- 1 July 1971
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 42 (7) , 999-1001
- https://doi.org/10.1063/1.1685323
Abstract
A scintillation detector system is described which can be used for dynamic diffraction studies. This system contains several individual channels with each channel (consisting of a scintillator, light pipe, and photomultiplier tube) positioned at a unique 2θ position; thus, measurement of diffracted intensity vs 2θ can be made. Signal‐to‐background ratio for the (200) reflection of powdered LiF using copper radiation was measured to be 3.0. Angular resolution depends upon the scintillator size and proximity to the x‐ray source. For a four‐channel system used in x‐ray diffraction studies of material undergoing shock wave compression [Q. Johnson, A. Mitchell, R. Keeler, and L. Evans, Phys. Rev. Lett. 25, 1099 (1970)] angular resolution was about 1° in 2θ. This resolution can be increased by methods which increase signal strength.Keywords
This publication has 4 references indexed in Scilit:
- X-Ray Diffraction During Shock-Wave CompressionPhysical Review Letters, 1970
- X-ray Diffraction Experiments in Nanosecond Time IntervalsNature, 1967
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- Notizen: Über eine praktische Aufstellung eines normal ausgerüsteten PolarographenZeitschrift für Naturforschung A, 1950