Angle-resolved measurements of the secondary-electron emission spectrum of Cu(100)

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Abstract
Angle-resolved measurements of the secondary-electron emission spectrum of the Cu(100) surface have been performed in order to investigate the nature of the temperature dependent peaks observed in the 100–300 eV range of the angle-integrated spectrum. Spectra obtained for emission along directions in the (010) and (011̄) planes show that the peaks result from a superposition of structure in the energy distribution which varies rapidly as a function of emission angle. The interpretation of the peaks in the angle-integrated spectrum in terms of diffraction phenomena is discussed in light of the angle-resolved data.

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