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Electron-Microprobe Characterization of Vapor-Grown InAs[sub 1−x]P[sub x] Layers
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Electron-Microprobe Characterization of Vapor-Grown InAs[sub 1−x]P[sub x] Layers
Electron-Microprobe Characterization of Vapor-Grown InAs[sub 1−x]P[sub x] Layers
JB
James R. Buckmelter
James R. Buckmelter
JK
John K. Kennedy
John K. Kennedy
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1 January 1973
journal article
Published by
The Electrochemical Society
in
Journal of the Electrochemical Society
Vol. 120
(1)
,
133
https://doi.org/10.1149/1.2403385
Abstract
No abstract available
Keywords
ELECTRON MICROPROBE
MICROPROBE CHARACTERIZATION
SUB X
CHARACTERIZATION OF VAPOR
VAPOR GROWN INAS
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Cited by 6 articles
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