H2 Cracking at SiO2 Defect Centers
- 14 January 2000
- journal article
- Published by American Chemical Society (ACS) in The Journal of Physical Chemistry A
- Vol. 104 (20) , 4674-4684
- https://doi.org/10.1021/jp993214f
Abstract
No abstract availableThis publication has 46 references indexed in Scilit:
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