The microstructure of ultrahard material compacts studied by transmission electron microscopy
- 1 December 1988
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 105-106, 549-553
- https://doi.org/10.1016/0025-5416(88)90742-2
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Characteristics of diamond regrowth in a synthetic diamond compactJournal of Materials Science, 1988
- A transmission electron microscope study of a cubic boron nitride-based compact material with AIN and AIB2 binder phasesJournal of Materials Science, 1987
- Transmission electron microscopic observations of deformation and microtwinning in a synthetic diamond compactJournal of Materials Science Letters, 1983
- Sintered Superhard MaterialsScience, 1980