Interface structure of the 1 monolayer (2×1)-Si/GaAs(001) system by x-ray photoelectron diffraction
- 1 July 1993
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 11 (4) , 1459-1462
- https://doi.org/10.1116/1.586912
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: