New method for determining refractive index and thickness of fluorescent thin films
- 1 December 1979
- journal article
- Published by Elsevier in Optics Communications
- Vol. 31 (3) , 251-256
- https://doi.org/10.1016/0030-4018(79)90190-1
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Changes in fluorescence lifetimes induced by variation of of the radiating molecules' optical environmentOptics Communications, 1979
- Light emission by magnetic and electric dipoles close to a plane dielectric interface II Radiation patterns of perpendicular oriented dipolesJournal of the Optical Society of America, 1977
- Multiple Nature of Elementary Sources of Radiation—Wide-Angle InterferencePhysical Review B, 1941