Focal plane temperature stability requirements for thermal imaging systems using extrinsic Si:In detectors
- 1 August 1979
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 18 (15) , 2598-2601
- https://doi.org/10.1364/ao.18.002598
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 2 references indexed in Scilit:
- A new acceptor level in indium-doped siliconApplied Physics Letters, 1977
- Research into the Dynamic Nature of the Human Fovea→Cortex Systems with Intermittent and Modulated Light I Attenuation Characteristics with White and Colored LightJournal of the Optical Society of America, 1958