On the roughness of ideally planar H–Si(111) surfaces. An atomic force microscopy approach
- 11 August 1998
- journal article
- Published by Elsevier in Surface Science
- Vol. 411 (1-2) , L839-L843
- https://doi.org/10.1016/s0039-6028(98)00406-3
Abstract
No abstract availableKeywords
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