Memory traps in MNOS diodes measured by thermally stimulated current
- 31 January 1976
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 19 (1) , 11-16
- https://doi.org/10.1016/0038-1101(76)90125-8
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
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