AN X-RAY SPECTROMETER WITH STATIONARY ION CHAMBER

Abstract
A Bragg type ionization x‐ray spectrometer which was designed for making quantitative measurements of integrated x‐ray intensities reflected from crystals is described. The essential feature of the design is that the ionization chamber is fixed in position, thus allowing a short fixed connection between ion chamber and electrometer (Hoffman). The ion chamber and x‐ray tube used with the instrument are described.

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