Deformation-Free Topography from Combined Scanning Force and Tunnelling Experiments
- 20 August 1993
- journal article
- Published by IOP Publishing in Europhysics Letters
- Vol. 23 (6) , 421-426
- https://doi.org/10.1209/0295-5075/23/6/007
Abstract
We show that by measuring force and stiffness on a constant-current scanning tunnelling microscopy (STM) contour a deformation-free topography can be extracted. With reference to mono- and bicomponent self-assembled monolayers, we find that the characteristic depression pattern and the protrusions on a multicomponent film found in STM are to a great extent due to electronic effects.Keywords
This publication has 14 references indexed in Scilit:
- STM: 10 years afterUltramicroscopy, 1992
- Atomic-force-microscope study of polymer lubricants on silicon surfacesPhysical Review Letters, 1992
- Compact, combined scanning tunneling/force microscopeReview of Scientific Instruments, 1992
- Comparison of the structures and wetting properties of self-assembled monolayers of n-alkanethiols on the coinage metal surfaces, copper, silver, and goldJournal of the American Chemical Society, 1991
- Alternative method of imaging surface topologies of nonconducting bulk specimens by scanning tunneling microscopyPhysical Review Letters, 1991
- Rastertunnelmikroskopische Beobachtung von spezifisch adsorbiertem Streptavidin auf Biotin‐funktionalisierten, selbstorganisierten MonoschichtenAngewandte Chemie, 1991
- Roles of the attractive and repulsive forces in atomic-force microscopyPhysical Review B, 1991
- Separation of magnetic and topographic effects in force microscopyJournal of Applied Physics, 1990
- Structures of self-assembled monolayer films of organosulfur compounds adsorbed on gold single crystals: electron diffraction studiesLangmuir, 1988
- Organized monolayers by adsorption. 1. Formation and structure of oleophobic mixed monolayers on solid surfacesJournal of the American Chemical Society, 1980