Cost Model for Testing Program Based on Nonhomogeneous Poisson Failure Model
- 1 August 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. R-26 (3) , 189-194
- https://doi.org/10.1109/TR.1977.5220112
Abstract
A model for the s-expected cost of a development testing program is presented in this paper. The total cost function consists of two terms. The first term is proportional to the duration of the testing program; the second term is a loss function that assesses additional costs for failure to meet reliability goals during the testing program. The reliability growth model assumes that failures during the program occur according to a nonhomogeneous Poisson process having a power-law rate. An example shows how the duration of the test program can be chosen to minimize s-expected total cost.Keywords
This publication has 1 reference indexed in Scilit:
- Learning Curve Approach to Reliability MonitoringIEEE Transactions on Aerospace, 1964