Force microscopy of magnetization patterns in longitudinal recording media
- 17 October 1988
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 53 (16) , 1563-1565
- https://doi.org/10.1063/1.99952
Abstract
A force microscope with a magnetic tip has been used to examine magnetization patterns in a thin-film cobalt-alloy sample similar to that used in magnetic disk recording. Longitudinal magnetic bits were written on discrete tracks with a recording head flown over the surface of the sample. After minimal sample preparation, images were obtained showing strong magnetic contrast. Model calculations for the expected image contrast were found to be in excellent qualitative agreement with experimental results. By using a constant height imaging mode, enhanced contrast for fine detail was obtained.Keywords
This publication has 9 references indexed in Scilit:
- Theory of magnetic imaging by force microscopyApplied Physics Letters, 1988
- Measurement of in-plane magnetization by force microscopyApplied Physics Letters, 1988
- High-resolution magnetic imaging of domains in TbFe by force microscopyApplied Physics Letters, 1988
- The theoretical aspect of atomic force microscopy used for magnetic materialsJournal of Magnetism and Magnetic Materials, 1988
- Observation of magnetic forces by the atomic force microscopeJournal of Applied Physics, 1987
- Recording characteristics of submicron discrete magnetic tracksIEEE Transactions on Magnetics, 1987
- Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolutionApplied Physics Letters, 1987
- Imaging in real time with the tunneling microscopeApplied Physics Letters, 1986
- Atomic Force MicroscopePhysical Review Letters, 1986