Detection of Molecular Alignment in Confined Films
- 21 January 2000
- journal article
- other
- Published by American Association for the Advancement of Science (AAAS) in Science
- Vol. 287 (5452) , 468-470
- https://doi.org/10.1126/science.287.5452.468
Abstract
Optical second harmonic generation was used to study the in-plane alignment of self-assembled silane monolayers attached to a glass surface under mechanical loading. The measurements allow correlation of the macroscopic forces acting on the monolayer with the average orientation and the azimuthal molecular alignment of the terminal molecular entity. Compression and shear forces lead to an alignment of the initially randomly oriented molecules on a macroscopic length scale. The change in azimuthal alignment of molecules under mechanical stress was found to be irreversible on the time scale of 12 hours, whereas changes of the molecular tilt angle were reversible.Keywords
This publication has 20 references indexed in Scilit:
- In Situ Vibrational Spectroscopy of an Organic Monolayer at the Sapphire−Quartz InterfaceJournal of the American Chemical Society, 1998
- Nonlinear optical studies of monomolecular films under pressurePhysical Review B, 1995
- Order-Disorder Transition during Approach and Separation of Two Parallel SurfacesPhysical Review Letters, 1994
- Compression-Induced Structural Transition in a Self-Assembled MonolayerLangmuir, 1994
- Simulations of Self-Assembled Monolayers under Compression: Effect of Surface AsperitiesLangmuir, 1994
- The X-Ray Surface Forces Apparatus: Structure of a Thin Smectic Liquid Crystal Film Under ConfinementScience, 1994
- Optical second harmonic generation as a probe of surface chemistryChemical Reviews, 1994
- Optical second-harmonic generation from adsorbate layers in total-reflection geometryJournal of the Optical Society of America B, 1993
- Domain formation and system-size dependence in simulations of self-assembled monolayersLangmuir, 1993
- Mechanical relaxation of organic monolayer films measured by force microscopyPhysical Review Letters, 1992